𝗗𝘂𝗯𝗲𝗼𝗻 𝗖𝗼𝗿𝗽𝗼𝗿𝗮𝘁𝗶𝗼𝗻 𝗼𝗳𝗳𝗲𝗿𝘀 𝗯𝘂𝗶𝗹𝗱/𝗿𝗲𝗯𝘂𝗶𝗹𝗱 𝗼𝗳 𝗯𝗹𝗮𝗱𝗲 𝗽𝗿𝗼𝗯𝗲 𝗰𝗮𝗿𝗱𝘀 𝘂𝘀𝗲𝗱 𝗶𝗻 𝗽𝗿𝗼𝗯𝗶𝗻𝗴 𝗼𝗳 𝗦𝗲𝗺𝗶𝗰𝗼𝗻𝗱𝘂𝗰𝘁𝗼𝗿 𝘄𝗮𝗳𝗲𝗿𝘀.

Blade probe cards are highly suitable for testing of low pin count, high current, and high voltage devices.

Probe materials can be customized using Tungsten, Tungsten Rhenium and Beryllium Copper.

We also supply ceramic burnishers and lapping films for in-situ cleaning of probe tips for consistent contact resistance and product yield.